Transmission Electron Microscope
JEOL 2010F Transmission Electron Microscope
This instrument is an advanced and digitally dedicated transmission electron microscope operating at 200kV with a field-emission gun. It is capable of an ultimate point-to-point resolution of 0.19 nm, with the ability to image lattice fringes at 0.14 nm resolution. It is a multipurpose ultrahigh resolution analytical electron microscope with a wide range of capabilities such as high-resolution image observation, nanoarea X-ray analysis, versatile analysis by convergent-beam electron diffraction, and analysis of the atomic structure and/or bonding state of atoms. With the addition of Energy dispersive X-ray spectrometer (EDS) and Parallel electron energy loss spectrometer (PEELS), the field-emission TEM can also be used as an elemental analysis tool, capable of identifying the elements in areas less than 2 nm in diameter.
- 200 kV, Schottky Field Emission Gun
- Ultra High Resolution Pole Piece (Cs=0.5 mm)
- 0.19 nm Point-to-Point Resolution
- Minimum Beam Size: 0.5 nm
- JEOL Single Tilt Low Background Holder
- JEOL Double Tilt Low Background Holder
- Double Tilt Heating Holder (Maximum Temperature: 1000潞C)
- Specimen Tilt Angle (X axis): 卤20潞
- High Resolution Imaging
- Convergent Beam Electron Diffraction (CBED)
- Energy Dispersive X-Ray Analysis (EDS)
- Electron Energy Loss Spectroscopy (EELS)
TEM Facility User Rates (Per Hour) | ||||||
听 | External Commercial (profit) | External Academic (non-profit) | Internal | |||
听 | Facility 听Operator | Self 听Operator | Facility 听Operator | Self Operator | Facility Operator | Self Operator |
TEM | $250 | $150 | $160 | $60 | $140 | $40 |
The microscope is located in Higgins 030. For all microscope questions and training, please contact:听Bret Judson.
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